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MR
2010
120views Robotics» more  MR 2010»
13 years 5 months ago
Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
S. Brand, P. Czurratis, P. Hoffrogge, M. Petzold
ICCAD
2006
IEEE
112views Hardware» more  ICCAD 2006»
14 years 4 months ago
A new RLC buffer insertion algorithm
Most existing buffering algorithms neglect the impact of inductance on circuit performance, which causes large error in circuit analysis and optimization. Even for the approaches...
Zhanyuan Jiang, Shiyan Hu, Jiang Hu, Zhuo Li, Weip...
ICCAD
2006
IEEE
101views Hardware» more  ICCAD 2006»
14 years 4 months ago
A spectrally accurate integral equation solver for molecular surface electrostatics
Electrostatic analysis of complicated molecular surfaces arises in a number of nanotechnology applications including: biomolecule design, carbon nanotube simulation, and molecular...
Shih-Hsien Kuo, Jacob White
ICCAD
2003
IEEE
109views Hardware» more  ICCAD 2003»
14 years 4 months ago
Large-Scale Circuit Placement: Gap and Promise
Placement is one of the most important steps in the RTLto-GDSII synthesis process, as it directly defines the interconnects, which have become the bottleneck in circuit and syste...
Jason Cong, Tim Kong, Joseph R. Shinnerl, Min Xie,...
ISPD
2010
ACM
195views Hardware» more  ISPD 2010»
14 years 2 months ago
Density gradient minimization with coupling-constrained dummy fill for CMP control
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
Huang-Yu Chen, Szu-Jui Chou, Yao-Wen Chang