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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 2 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
DPPI
2007
ACM
14 years 10 days ago
How probes inform and influence the design process
Design and research practitioners have applied probes in their design processes to find new ways of understanding user experience, allowing them to obtain a better understanding of...
Andrés Lucero, Tatiana Lashina, Elmo M. A. ...
IS
2007
13 years 8 months ago
Security Attack Testing (SAT) - testing the security of information systems at design time
For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
Haralambos Mouratidis, Paolo Giorgini
AISS
2010
107views more  AISS 2010»
13 years 5 months ago
A Practical Method of Reducing the Gaps in e-Government Interoperability Implementation: Case of Patient Referral Information Ex
In recent years, e-government interoperability frameworks (e-GIFs) and enterprise architectures (EAs) have been extensively developed as mechanism tools for achieving the interope...
Apitep Saekow, Choompol Boonmee
ACMSE
2007
ACM
14 years 13 days ago
A case study in test management
Testing is an essential but often under-utilized area of software engineering. A variety of software testing techniques have been developed to effectively identify bugs in source ...
Tauhida Parveen, Scott R. Tilley, George Gonzalez