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VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
KBSE
2008
IEEE
14 years 3 months ago
2008
IEEE
—Automatic white-box test generation is a challenging problem. Many existing tools rely on complex code analyses and heuristics. As a result, structural features of an input prog...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
IJCNN
2006
IEEE
14 years 3 months ago
2006
IEEE
—Two approaches to building models for prediction of the onset of Type 1 diabetes mellitus in juvenile subjects were examined. A set of tests performed immediately before diagnos...
BMCBI
2006
13 years 9 months ago
2006
Background: The evolution of alternatively spliced exons (ASEs) is of primary interest because these exons are suggested to be a major source of functional diversity of proteins. ...