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» Impact of NBTI on FPGAs
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ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
14 years 1 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
TVLSI
2010
13 years 2 months ago
Enhancing the Area Efficiency of FPGAs With Hard Circuits Using Shadow Clusters
There is a dramatic logic density gap between FPGAs and ASICs, and this gap is the main reason FPGAs are not cost-effective in high volume applications. Modern FPGAs narrow this ga...
Peter A. Jamieson, Jonathan Rose
FPGA
2012
ACM
300views FPGA» more  FPGA 2012»
12 years 3 months ago
Reducing the cost of floating-point mantissa alignment and normalization in FPGAs
In floating-point datapaths synthesized on FPGAs, the shifters that perform mantissa alignment and normalization consume a disproportionate number of LUTs. Shifters are implemente...
Yehdhih Ould Mohammed Moctar, Nithin George, Hadi ...
FCCM
2011
IEEE
241views VLSI» more  FCCM 2011»
12 years 11 months ago
Multilevel Granularity Parallelism Synthesis on FPGAs
— Recent progress in High-Level Synthesis (HLS) es has helped raise the abstraction level of FPGA programming. However implementation and performance evaluation of the HLS-genera...
Alexandros Papakonstantinou, Yun Liang, John A. St...
DATE
2009
IEEE
73views Hardware» more  DATE 2009»
14 years 2 months ago
A study of the Single Event Effects impact on functional mapping within Flash-based FPGAs
—Flash-based FPGAs are increasingly demanded in safety critical fields, in particular space and avionic ones, due to their non-volatile configuration memory. Although they are al...
Francesco Abate, Luca Sterpone, Massimo Violante, ...