119 search results - page 18 / 24 » Impact of Technology Scaling on Digital Subthreshold Circuit... |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...
IOLTS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...