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ICCAD
2008
IEEE
106views Hardware» more  ICCAD 2008»
14 years 4 months ago
Process variability-aware transient fault modeling and analysis
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
Natasa Miskov-Zivanov, Kai-Chiang Wu, Diana Marcul...
TVLSI
2008
176views more  TVLSI 2008»
13 years 7 months ago
A Fuzzy Optimization Approach for Variation Aware Power Minimization During Gate Sizing
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
DAC
2008
ACM
14 years 8 months ago
The synthesis of robust polynomial arithmetic with stochastic logic
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
Weikang Qian, Marc D. Riedel
VLSID
2007
IEEE
149views VLSI» more  VLSID 2007»
14 years 8 months ago
Efficient and Accurate Statistical Timing Analysis for Non-Linear Non-Gaussian Variability With Incremental Attributes
Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...
Ashish Dobhal, Vishal Khandelwal, Ankur Srivastava
ISPD
2006
ACM
68views Hardware» more  ISPD 2006»
14 years 1 months ago
Solving hard instances of floorplacement
Physical Design of modern systems on chip is extremely challenging. Such digital integrated circuits often contain tens of millions of logic gates, intellectual property blocks, e...
Aaron N. Ng, Igor L. Markov, Rajat Aggarwal, Venky...