3 search results - page 1 / 1 » Improved Algorithms for Constructive Multi-Phase Test Point ... |
110
Voted
VLSID
2002
IEEE
16 years 3 months ago
2002
IEEE
131
Voted
VTS
2007
IEEE
15 years 9 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
138
click to vote
WACV
2005
IEEE
15 years 9 months ago
2005
IEEE
The performance of face recognition systems that use two-dimensional images depends on consistent conditions w.r.t. lighting, pose, and facial appearance. We are developing a face...