2201 search results - page 216 / 441 » Improvement of ASIC Design Processes |
100
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ICASSP
2011
IEEE
14 years 7 months ago
2011
IEEE
In this paper we consider the problem of detecting multiple point-like targets in the presence of steering vector mismatches and Gaussian disturbance with unknown covariance matri...
123
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ICCAD
2006
IEEE
16 years 26 days ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
131
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ISVLSI
2008
IEEE
15 years 10 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
118
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
This paper tackles the problem of dynamic power management (DPM) in nanoscale CMOS design technologies that are typically affected by increasing levels of process, voltage, and te...
184
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RTCSA
2005
IEEE
15 years 9 months ago
2005
IEEE
Embedded systems are usually resource limited in terms of processing power, memory, and power consumption, thus embedded TCP/IP should be designed to make the best use of limited ...