1117 search results - page 5 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
TOOLS
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ACSAC
2007
IEEE
14 years 1 months ago
2007
IEEE
The effectiveness and precision of network-based intrusion detection signatures can be evaluated either by direct analysis of the signatures (if they are available) or by using bl...
ICDAR
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we study different methods for prototype selection for recognizing handwritten characters of Tamil script. In the first method, cumulative pairwise- distances of th...