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DATE
2008
IEEE
109views Hardware» more  DATE 2008»
14 years 2 months ago
Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad...
FUIN
2007
147views more  FUIN 2007»
13 years 7 months ago
Privacy Preserving Database Generation for Database Application Testing
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Xintao Wu, Yongge Wang, Songtao Guo, Yuliang Zheng
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 8 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
EMSOFT
2006
Springer
13 years 11 months ago
Software partitioning for effective automated unit testing
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
Arindam Chakrabarti, Patrice Godefroid
EMSOFT
2007
Springer
14 years 1 months ago
Performance estimation of distributed real-time embedded systems by discrete event simulations
Key challenges in the performance estimation of distributed real-time embedded (DRE) systems include the systematic measurement of coverage by simulations, and the automated gener...
Gabor Madl, Nikil Dutt, Sherif Abdelwahed