259 search results - page 18 / 52 » Improving coverage analysis and test generation for large de... |
POLICY
2007
Springer
14 years 1 months ago
2007
Springer
The implementation of network security devices such as firewalls and IDSs are constantly being improved to accommodate higher security and performance standards. Using reliable a...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
VLSID
2001
IEEE
14 years 8 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ICSM
2002
IEEE
14 years 13 days ago
2002
IEEE
The Object Relation Diagram (ORD) of a program is a class interdependence diagram which has applications in a wide variety of software engineering problems (e.g., integration test...