259 search results - page 26 / 52 » Improving coverage analysis and test generation for large de... |
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
BMCBI
2006
13 years 7 months ago
2006
Background: Recursive Feature Elimination is a common and well-studied method for reducing the number of attributes used for further analysis or development of prediction models. ...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
ASPLOS
2011
ACM
12 years 11 months ago
2011
ACM
Diagnosing software failures in the field is notoriously difficult, in part due to the fundamental complexity of trouble-shooting any complex software system, but further exacer...
BMCBI
2007
13 years 7 months ago
2007
Background: When conducting multiple hypothesis tests, it is important to control the number of false positives, or the False Discovery Rate (FDR). However, there is a tradeoff be...