Continuous evolution in process technology brings energyefficiency and reliability challenges, which are harder for memory system designs since chip multiprocessors demand high ba...
Jung Ho Ahn, Norman P. Jouppi, Christos Kozyrakis,...
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
The ever increasing die area of Chip Multiprocessors (CMPs) affects manufacturing yield, resulting in higher manufacture cost. Meanwhile, network-on-chip (NoC) has emerged as a p...
Shrinking process technologies and growing chip sizes have profound effects on process variation. This leads to Chip Multiprocessors (CMPs) where not all cores operate at maximum f...
Major Bhadauria, Vincent M. Weaver, Sally A. McKee
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...