39 search results - page 6 / 8 » Improving yield and reliability of chip multiprocessors |
SC
2009
ACM
14 years 3 months ago
2009
ACM
Continuous evolution in process technology brings energyefficiency and reliability challenges, which are harder for memory system designs since chip multiprocessors demand high ba...
ISCA
2005
IEEE
14 years 2 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
DAC
2010
ACM
14 years 21 days ago
2010
ACM
The ever increasing die area of Chip Multiprocessors (CMPs) affects manufacturing yield, resulting in higher manufacture cost. Meanwhile, network-on-chip (NoC) has emerged as a p...
HIPEAC
2009
Springer
14 years 1 days ago
2009
Springer
Shrinking process technologies and growing chip sizes have profound effects on process variation. This leads to Chip Multiprocessors (CMPs) where not all cores operate at maximum f...
HPCA
2006
IEEE
14 years 9 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...