137 search results - page 16 / 28 » Increasing the Efficiency of Fault Detection in Modified Cod... |
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
IEEEPACT
2006
IEEE
14 years 1 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
SUTC
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Sensor networks are being increasingly deployed for collecting critical data in various applications. Once deployed, a sensor network may experience faults at the indiv...
IPPS
2006
IEEE
14 years 1 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
ICIP
2009
IEEE
14 years 8 months ago
2009
IEEE
In this paper, we perform double embedding in the quantization index modulation (QIM) framework where a single coefficient is modified twice, using two quantizers, to embed two bi...