Sciweavers

137 search results - page 26 / 28
» Increasing the Efficiency of Fault Detection in Modified Cod...
Sort
View
ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
14 years 2 months ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...
HPCA
2008
IEEE
14 years 8 months ago
Supporting highly-decoupled thread-level redundancy for parallel programs
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
M. Wasiur Rashid, Michael C. Huang
DFT
2009
IEEE
154views VLSI» more  DFT 2009»
14 years 2 months ago
Dual-Layer Cooperative Error Control for Reliable Nanoscale Networks-on-Chip
We propose a framework that allows dual-layer cooperative error control in a nanoscale network-on-chip (NoC), to simultaneously improve reliability, performance and energy efficie...
Qiaoyan Yu, Paul Ampadu
TIFS
2008
154views more  TIFS 2008»
13 years 7 months ago
On the Distinguishability of Distance-Bounded Permutations in Ordered Channels
Ordered channels, such as those provided by Internet protocol and transmission control protocol protocols, rely on sequence numbers to recover from packet reordering due to network...
Juan M. Estévez-Tapiador, Julio Césa...
ECAI
2000
Springer
14 years 19 hour ago
Autosteve: Automated Electrical Design Analysis
AutoSteve performs automated electrical design based on qualitative simulation and functional abstraction. It is the first commercial product capable of performing these tasks for ...
Chris Price