54 search results - page 6 / 11 » Incremental Circuit Simulation Using Waveform Relaxation |
TCAD
2010
13 years 5 months ago
2010
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
ICCD
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper presents a verification technique for functional comparison of large combinational circuits using a novel combination of known approaches. The idea is based on a tight...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...