962 search results - page 45 / 193 » Input validation analysis and testing |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
INFORMATICALT
2007
13 years 9 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
FUIN
2007
13 years 9 months ago
2007
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
IDEAS
2005
IEEE
14 years 2 months ago
2005
IEEE
Testing of database applications is of great importance. A significant issue in database application testing consists in the availability of representative data. In this paper we...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...