29 search results - page 6 / 6 » Integrating BIST Techniques for On-Line SoC Testing |
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
CASES
2006
ACM
14 years 1 months ago
2006
ACM
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use high-level system design languages, such as SystemC, to model only the digital par...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...