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FATES
2005
Springer
14 years 3 months ago
Testing Systems of Concurrent Black-Boxes-An Automata-Theoretic and Decompositional Approach
The global testing problem studied in this paper is to seek a definite answer to whether a system of concurrent black-boxes has an observable behavior in a given finite (but cou...
Gaoyan Xie, Zhe Dang
DATE
2002
IEEE
89views Hardware» more  DATE 2002»
14 years 2 months ago
A Hierarchical Test Scheme for System-On-Chip Designs
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pi...
DAGSTUHL
2003
13 years 11 months ago
Components, Features, and Agents in the ABC
Abstract. In this paper, we show how the concepts of objects, components, features and agents are used today in the Agent Building Center (ABC) environment in order to marry the mo...
Tiziana Margaria
DATE
2005
IEEE
224views Hardware» more  DATE 2005»
14 years 3 months ago
Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
David C. Keezer, C. Gray, A. M. Majid, N. Taher
ISSRE
2002
IEEE
14 years 2 months ago
Optimal Allocation of Testing Resources for Modular Software Systems
In this paper, based on software reliability growth models with generalized logistic testing-effort function, we study three optimal resource allocation problems in modular softwa...
Chin-Yu Huang, Jung-Hua Lo, Sy-Yen Kuo, Michael R....