RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
Abstract. This paper introduces a new method for safety analysis called HiPHOPS (Hierarchically Performed Hazard Origin and Propagation Studies). HiP-HOPS originates from a number ...
Abstract This paper presents an approach to designing and implementing extensible computational models for perceiving systems based on a knowledge-driven joint inference approach. ...
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
A sensitivity analysis of resonant H-tree clock distribution networks is presented in this paper for a TSMC 0.18 μm CMOS technology. The analysis focuses on the effect of the dri...