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ICST
2009
IEEE
14 years 2 months ago
Unit Testing Non-functional Concerns of Component-based Distributed Systems
Unit testing component-based distributed systems traditionally involved testing functional concerns of the application logic throughout the development lifecycle. In contrast, tes...
James H. Hill, Hamilton A. Turner, James R. Edmond...
FASE
2012
Springer
12 years 3 months ago
Integration Testing of Software Product Lines Using Compositional Symbolic Execution
Software product lines are families of products defined by feature commonality and variability, with a well-managed asset base. Recent work in testing of software product lines ha...
Jiangfan Shi, Myra B. Cohen, Matthew B. Dwyer
ICSE
2003
IEEE-ACM
14 years 7 months ago
Constructing Test Suites for Interaction Testing
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
Myra B. Cohen, Peter B. Gibbons, Warwick B. Mugrid...
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 1 months ago
A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ITC
2003
IEEE
116views Hardware» more  ITC 2003»
14 years 22 days ago
BIST for Deep Submicron ASIC Memories with High Performance Application
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Ome...