412 search results - page 9 / 83 » Integrating customized test requirements with traditional re... |
DATE
2003
IEEE
14 years 22 days ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
ICSE
2007
IEEE-ACM
14 years 7 months ago
2007
IEEE-ACM
Designing complex multi-tier applications that must meet strict performance requirements is a challenging software engineering problem. Ideally, the application architect could de...
CHI
2007
ACM
14 years 7 months ago
2007
ACM
In this paper, we introduce an implementation for detailed monitoring of user actions on web pages. It addresses the problem that the log data recorded by standard web servers is ...
SIGMOD
2006
ACM
14 years 7 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...