855 search results - page 58 / 171 » Integration Testing of Composite Applications |
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
ISSRE
2002
IEEE
14 years 18 days ago
2002
IEEE
Spreadsheet languages are widely used by a variety of end users to perform many important tasks. Despite their perceived simplicity, spreadsheets often contain faults. Furthermore...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
EMNETS
2007
13 years 11 months ago
2007
Designing Wireless Sensor Networks (WSNs) has proven to be a slow, tedious and error-prone process due to the inherent intricacies of designing a distributed, wireless, and embedd...
VLSID
2000
IEEE
14 years 1 days ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...