89 search results - page 5 / 18 » Introduction to modeling and generating probabilistic input ... |
VTS
2002
IEEE
14 years 14 days ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
QEST
2010
IEEE
13 years 5 months ago
2010
IEEE
Adaptive techniques like voltage and frequency scaling, process variations and the randomness of input data contribute signi cantly to the statistical aspect of contemporary hardwa...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
ITC
2003
IEEE
14 years 25 days ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ECCV
2004
Springer
14 years 9 months ago
2004
Springer
We present a probabilistic framework for recognizing objects in images of cluttered scenes. Hundreds of objects may be considered and searched in parallel. Each object is learned f...