Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Heavyweight security analysis systems, such as taint analysis and dynamic type checking, are powerful technologies used to detect security vulnerabilities and software bugs. Tradi...
Joseph L. Greathouse, Ilya Wagner, David A. Ramos,...
— Fault tolerance in MPI becomes a main issue in the HPC community. Several approaches are envisioned from user or programmer controlled fault tolerance to fully automatic fault ...
Aurelien Bouteiller, Boris Collin, Thomas Hé...
We present a prototype that automatically aligns acoustic musical signals with their corresponding textual lyrics, in a manner similar to manually-aligned karaoke. We tackle this ...
Ye Wang, Min-Yen Kan, Tin Lay Nwe, Arun Shenoy, Ju...
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
Erik Jan Marinissen, Bart Vermeulen, Robert Madge,...