The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
This paper evaluates the suitability of the MapReduce model for multi-core and multi-processor systems. MapReduce was created by Google for application development on data-centers...
Fine-Grained Cycle Sharing (FGCS) systems aim at utilizing the large amount of computational resources available on the Internet. In FGCS, host computers allow guest jobs to utili...
Xiaojuan Ren, Seyong Lee, Rudolf Eigenmann, Saurab...
A master/worker paradigm for executing large-scale parallel discrete event simulation programs over networkenabled computational resources is proposed and evaluated. In contrast t...