95 search results - page 15 / 19 » Jitter in Ring Oscillators |
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
FPGA
2010
ACM
14 years 4 months ago
2010
ACM
Electronic systems increasingly suffer from component variation, thermal hotspots, uneven wearout, and other subtle physical phenomena. Systems based on FPGAs have unique opportun...
ISCAS
2008
IEEE
14 years 1 months ago
2008
IEEE
— This paper presents ATLAS - a framework for automated analog circuit synthesis that comprises of both topology generation and subsequent circuit sizing. A hierarchically arrang...
INFOCOM
1993
IEEE
13 years 11 months ago
1993
IEEE
We perform an exact analysis of the dynamic behavior of IGRP, an adaptive shortest-path routing algorithm widely used in the industry, on a simple ring network. The distance metri...