6757 search results - page 1303 / 1352 » Knowledge Analysis on Process Models |
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
MODELS
2009
Springer
14 years 4 months ago
2009
Springer
Product line engineering is an emerging paradigm of developing a family of products. While product line analysis and design mainly focus on reasoning about commonality and variabi...
CODES
2008
IEEE
14 years 4 months ago
2008
IEEE
Body-area sensor network or BAN-based health monitoring is increasingly becoming a popular alternative to traditional wired bio-monitoring techniques. However, most biomonitoring ...
CIVR
2007
Springer
14 years 4 months ago
2007
Springer
This paper describes the technical details of SemRetriev, a prototype system for image retrieval which combines the use of an ontology which structures an image repository and of ...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...