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DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 1 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
GECCO
2008
Springer
172views Optimization» more  GECCO 2008»
13 years 8 months ago
Empirical analysis of a genetic algorithm-based stress test technique
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
Vahid Garousi
ICSE
2009
IEEE-ACM
14 years 8 months ago
Taint-based directed whitebox fuzzing
We present a new automated white box fuzzing technique and a tool, BuzzFuzz, that implements this technique. Unlike standard fuzzing techniques, which randomly change parts of the...
Vijay Ganesh, Tim Leek, Martin C. Rinard
CVPR
2007
IEEE
14 years 1 months ago
Hierarchical Structuring of Data on Manifolds
Manifold learning methods are promising data analysis tools. However, if we locate a new test sample on the manifold, we have to find its embedding by making use of the learned e...
Jun Li, Pengwei Hao
ICSOC
2010
Springer
13 years 6 months ago
A Programmble Fault Injection Testbed Generator for SOA
In this demo paper we present the prototype of our fault injection testbed generator. Our tool empowers engineers to generate emulated SOA environments and to program fault injecti...
Lukasz Juszczyk, Schahram Dustdar