1295 search results - page 118 / 259 » Layered manufacturing technologies |
MICRO
2009
IEEE
14 years 3 months ago
2009
IEEE
Despite flash memory’s promise, it suffers from many idiosyncrasies such as limited durability, data integrity problems, and asymmetry in operation granularity. As architects, ...
ISPASS
2007
IEEE
14 years 3 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
ISCA
2010
IEEE
14 years 2 months ago
2010
IEEE
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
DSN
2004
IEEE
14 years 23 days ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
WSC
2004
13 years 10 months ago
2004
Nowadays, in a hotly competitive environment, companies are continuously trying to provide products and/or services to customers faster, cheaper, and better than the competitors d...