1295 search results - page 130 / 259 » Layered manufacturing technologies |
DAC
2005
ACM
14 years 10 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
VLSID
2008
IEEE
14 years 9 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
PERCOM
2007
ACM
14 years 8 months ago
2007
ACM
Radio Frequency Identification (RFID) is an increasingly popular technology that uses radio signals for object identification. Tracking and authentication in RFID tags have raised...
ICCD
2007
IEEE
14 years 6 months ago
2007
IEEE
Parameter variations are a major factor causing powerperformance asymmetry in chip multiprocessors. In this paper, we analyze the effects of with-in-die (WID) process variations o...