1295 search results - page 131 / 259 » Layered manufacturing technologies |
ICCD
2005
IEEE
14 years 6 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
In this paper we describe how Network-on-Chip (NoC) will be the next major challenge to implementing complex and function-rich applications in advanced manufacturing processes at ...
ICCD
2003
IEEE
14 years 6 months ago
2003
IEEE
DNA probe arrays have recently emerged as one of the core genomic technologies. Exploiting analogies between manufacturing processes for DNA arrays and for VLSI chips, we demonstr...
ICCD
2003
IEEE
14 years 6 months ago
2003
IEEE
There is currently a huge gap between the two main technologies used to implement custom digital integrated circuit (IC) designs. At one end of the spectrum are field programmable...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...