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GLVLSI
2003
IEEE
14 years 2 months ago
2003
IEEE
It is likely that it will become increasingly difficult to manufacture the complex, heterogeneous logic structures that characterise current reconfigurable logic systems. As a res...
ELPUB
2003
ACM
14 years 2 months ago
2003
ACM
Based on our field and desk-research , this paper will discuss the current situation of mobile telephones in relation to electronic publishing—a convergence that remains yet to ...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
The relative tolerances for interconnect and device parameter variations have not scaled with feature sizes which have brought about significant performance variability. As we sca...