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CODES
2007
IEEE
14 years 1 months ago
On the impact of manufacturing process variations on the lifetime of sensor networks
As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of indi...
Siddharth Garg, Diana Marculescu
ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
14 years 23 days ago
Interoperability Beyond Design: Sharing Knowledge between Design and Manufacturing
The nature of IC design has is necessarily evolving to a more data-centric design flow in which EDA tools share a common information in a design database without the negative cost...
D. R. Cottrell, T. J. Grebinski
DAC
1996
ACM
13 years 11 months ago
RTL Emulation: The Next Leap in System Verification
ion. Production use of text-based methodology has enabled designers to capture designs of hundreds of thousands of gates using graphic ESDA tools. Source: Data Quest (Verilog/VHDL ...
Sanjay Sawant, Paul Giordano
GLVLSI
2010
IEEE
131views VLSI» more  GLVLSI 2010»
14 years 9 days ago
Clock skew reduction by self-compensating manufacturing variability with on-chip sensors
This paper presents a self-compensation scheme of manufacturing variability for clock skew reduction. In the proposed scheme, a CDN with embedded variability sensors tunes variabl...
Shinya Abe, Kenichi Shinkai, Masanori Hashimoto, T...
WSC
1996
13 years 8 months ago
Controlling Activities in a Virtual Manufacturing Cell
Researchers at the National Institute of Standards and Technology are developing a virtual manufacturing cell. This cell will contain simulation models of a wide range of manufact...
Michael Iuliano, Albert Jones