1295 search results - page 7 / 259 » Layered manufacturing technologies |
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micr...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
The ever increasing die area of Chip Multiprocessors (CMPs) affects manufacturing yield, resulting in higher manufacture cost. Meanwhile, network-on-chip (NoC) has emerged as a p...
GCC
2003
Springer
14 years 20 days ago
2003
Springer
This paper presents firstly in the world the framework of Grid manufacturing, which neatly combines Grid technology with the infrastructure of advanced manufacturing technology. It...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
The rapidly expanding diversity of technology available at the nanoscale is disrupting the existing transistorcentric microelectronics design paradigm, resulting in nearly decade-l...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
The purpose of this paper is to apply characteristics of residual stress that causes cantilever beams to bend for manufacturing a micro-structured gas flow sensor. This study uses ...