228 search results - page 19 / 46 » Linear analysis of random process variability |
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
KDD
2009
ACM
14 years 8 months ago
2009
ACM
There is a wide variety of data mining methods available, and it is generally useful in exploratory data analysis to use many different methods for the same dataset. This, however...
TIP
2011
13 years 2 months ago
2011
This paper explores the mathematical and algorithmic properties of two sample-based microtexture models: random phase noise (RPN ) and asymptotic discrete spot noise (ADSN ). Thes...
ICMLA
2007
13 years 9 months ago
2007
Optimal Component Analysis (OCA) is a linear method for feature extraction and dimension reduction. It has been widely used in many applications such as face and object recognitio...