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ICCAD
2006
IEEE
124views Hardware» more  ICCAD 2006»
14 years 5 months ago
A linear-time approach for static timing analysis covering all process corners
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
Sari Onaissi, Farid N. Najm
ICCAD
2004
IEEE
127views Hardware» more  ICCAD 2004»
14 years 5 months ago
A yield improvement methodology using pre- and post-silicon statistical clock scheduling
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
Jeng-Liang Tsai, Dong Hyun Baik, Charlie Chung-Pin...
CVPR
2010
IEEE
14 years 4 months ago
Increasing depth resolution of Electron Microscopy of Neural circuits using Sparse Tomographic reconstruction
Future progress in neuroscience hinges on reconstruction of neuronal circuits to the level of individual synapses. Because of the specifics of neuronal architecture, imaging must ...
Ashok Veeraraghavan, Alex Genkin, Shiv Vitaladevun...
CVPR
2010
IEEE
14 years 4 months ago
Online-Batch Strongly Convex Multi Kernel Learning
Several object categorization algorithms use kernel methods over multiple cues, as they offer a principled approach to combine multiple cues, and to obtain state-of-theart perform...
Francesco Orabona, Jie Luo, Barbara Caputo
CVPR
2010
IEEE
14 years 4 months ago
Learning Shift-Invariant Sparse Representation of Actions
A central problem in the analysis of motion capture (Mo- Cap) data is how to decompose motion sequences into primitives. Ideally, a description in terms of primitives should fac...
Yi Li