654 search results - page 73 / 131 » Linearity Testing in Characteristic Two |
VLSI
2007
Springer
14 years 3 months ago
2007
Springer
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
The existence of non-uniform thermal gradients on the substrate in high performance IC’s can significantly impact the performance of global on-chip interconnects. This issue is...
ICMCS
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper, we present an AUC (i.e., the Area Under the Curve of Receiver Operating Characteristics (ROC)) maximization based learning algorithm to design the classifier for ma...
ICDM
2005
IEEE
14 years 2 months ago
2005
IEEE
The problem of record linkage focuses on determining whether two object descriptions refer to the same underlying entity. Addressing this problem effectively has many practical ap...
CTRSA
2003
Springer
14 years 2 months ago
2003
Springer
In this paper, we present a general framework for evaluating the performance characteristics of block cipher structures composed of S-boxes and Maximum Distance Separable (MDS) ma...