Sciweavers

3995 search results - page 696 / 799
» Linearization of hybrid processes
Sort
View
ICSE
2001
IEEE-ACM
15 years 8 months ago
Fast Formal Analysis of Requirements via "Topoi Diagrams"
Early testing of requirements can decrease the cost of removing errors in software projects. However, unless done carefully, that testing process can significantly add to the cos...
Tim Menzies, John D. Powell, Michael E. Houle
WABI
2001
Springer
15 years 8 months ago
A Chemical-Distance-Based Test for Positive Darwinian Selection
There are very few instances in which positive Darwinian selection has been convincingly demonstrated at the molecular level. In this study, we present a novel test for detecting p...
Tal Pupko, Roded Sharan, Masami Hasegawa, Ron Sham...
DATE
2000
IEEE
140views Hardware» more  DATE 2000»
15 years 8 months ago
Parallel and Distributed VHDL Simulation
This paper presents a methodology for parallel and distributed simulation of VHDL using the PDES (parallel discrete-event simulation) paradigm. To achieve better features and perf...
Dragos Lungeanu, C.-J. Richard Shi
ICCAD
2000
IEEE
94views Hardware» more  ICCAD 2000»
15 years 8 months ago
Corner Block List: An Effective and Efficient Topological Representation of Non-Slicing Floorplan
––In this paper, a corner block list — a new efficient topological representation for non-slicing floorplan is proposed with applications to VLSI floorplan and building block...
Xianlong Hong, Gang Huang, Yici Cai, Jiangchun Gu,...
ITC
2000
IEEE
88views Hardware» more  ITC 2000»
15 years 8 months ago
Predicting device performance from pass/fail transient signal analysis data
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
James F. Plusquellic, Amy Germida, Jonathan Hudson...