23 search results - page 3 / 5 » Logic BIST for large industrial designs: real issues and cas... |
RTSS
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Many embedded platforms consist of a heterogeneous collection of processing elements, memory modules, and communication subsystems. These components often implement diff...
CONEXT
2008
ACM
13 years 9 months ago
2008
ACM
Chronic network conditions are caused by performance impairing events that occur intermittently over an extended period of time. Such conditions can cause repeated performance deg...
BPM
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. The coordination of complex process structures is a fundamental task for enterprises, such as in the automotive industry. Usually, such process structures consist of seve...
TCAD
2010
13 years 2 months ago
2010
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...