2299 search results - page 432 / 460 » Logical Data Expiration |
ICSE
2011
IEEE-ACM
12 years 11 months ago
2011
IEEE-ACM
Considerable progress has been made towards automatic support for one of the principal techniques available to enhance program reliability: equipping programs with extensive contr...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Tools and a design methodology have been developed to support partial run-time reconfiguration of FPGA logic on the Field Programmable Port Extender. High-speed Internet packet pr...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
ICML
2005
IEEE
14 years 8 months ago
2005
IEEE
Many real-world domains exhibit rich relational structure and stochasticity and motivate the development of models that combine predicate logic with probabilities. These models de...