980 search results - page 122 / 196 » Logical Testing |
ISMVL
2000
IEEE
14 years 1 months ago
2000
IEEE
We have developed two novel methods of fabricating very small Si single-electron transistors (SETs), called PAtternDependent OXidation (PADOX) and Vertical PAttern-Dependent OXida...
GLVLSI
2009
IEEE
14 years 20 days ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
AAAI
1990
13 years 10 months ago
1990
This paper presents a new approach for exploiting Truth Maintenance Systems(TMSs) which makes them simpler to use without necessarily incurring a substantial performance penalty. ...
CORR
2007
Springer
13 years 8 months ago
2007
Springer
This is to present work on modifying the Aleph ILP system so that it evaluates the hypothesised clauses in parallel by distributing the data-set among the nodes of a parallel or di...
ICSE
2007
IEEE-ACM
14 years 9 months ago
2007
IEEE-ACM
The Alloy tool-set has been gaining popularity as an alternative to traditional manual testing and checking for design correctness. Alloy uses a first-order relational logic for m...