980 search results - page 23 / 196 » Logical Testing |
DAC
2003
ACM
14 years 24 days ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
LANMR
2007
13 years 9 months ago
2007
Abstract We study the notion of strong equivalence between two disjunctive logic programs under the G3-stable model semantics, also called the P-stable semantics, and we show how s...
ASPDAC
2004
ACM
14 years 29 days ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
VTS
2002
IEEE
14 years 13 days ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...