980 search results - page 3 / 196 » Logical Testing |
ISSRE
2008
IEEE
14 years 1 months ago
2008
IEEE
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
The objective of this paper is to define a minimum number of configurations for testing the configurable modules that interface the global interconnect and the logic cells of SRAM...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...
MTDT
2003
IEEE
14 years 22 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
PTS
1998
13 years 8 months ago
1998
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...