980 search results - page 41 / 196 » Logical Testing |
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
LPAR
2012
Springer
12 years 3 months ago
2012
Springer
Abstract. We present a novel counterexample generator for the interactive theorem prover Isabelle based on a compiler that synthesizes test data generators for functional programmi...
FATES
2003
Springer
14 years 25 days ago
2003
Springer
Abstract. In this paper we propose an approach to automatically produce test cases allowing to check the satis ability of a linear property on a given implementation. Linear proper...
ICCAD
1998
IEEE
13 years 12 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
SPLC
2008
13 years 9 months ago
2008
The automated analysis of Feature Models (FMs) focuses on the usage of different logic paradigms and solvers to implement a number of analysis operations on FMs. The implementatio...