980 search results - page 45 / 196 » Logical Testing |
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...
MEMOCODE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
CALCO
2005
Springer
14 years 1 months ago
2005
Springer
Every endofunctor B on the category Set can be lifted to a fibred functor on the category (fibred over Set) of equivalence relations and relation-preserving functions. In this pa...
ET
2002
13 years 7 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
KI
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. Knowledge compilation is a common technique for propositional logic knowledge bases. The idea is to transform a given knowledge base into a special normal form ([MR03],[D...