1010 search results - page 122 / 202 » Logics for Contravariant Simulations |
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
ISCA
2005
IEEE
14 years 1 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
MICRO
2006
IEEE
13 years 8 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
ASYNC
2000
IEEE
14 years 21 days ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
QEST
2005
IEEE
14 years 1 months ago
2005
IEEE
iLTL is a probabilistic temporal logic that can specify properties of multiple discrete time Markov chains (DTMCs). In this paper, we describe two related tools: MarkovEstimator a...