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DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
14 years 8 months ago
Dynamic hardware plugins in an FPGA with partial run-time reconfiguration
Tools and a design methodology have been developed to support partial run-time reconfiguration of FPGA logic on the Field Programmable Port Extender. High-speed Internet packet pr...
Edson L. Horta, John W. Lockwood, David E. Taylor,...
DAC
2004
ACM
14 years 8 months ago
Virtual memory window for application-specific reconfigurable coprocessors
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
Miljan Vuletic, Laura Pozzi, Paolo Ienne
SIGSOFT
2007
ACM
14 years 8 months ago
Efficient checkpointing of java software using context-sensitive capture and replay
Checkpointing and replaying is an attractive technique that has been used widely at the operating/runtime system level to provide fault tolerance. Applying such a technique at the...
Guoqing Xu, Atanas Rountev, Yan Tang, Feng Qin
ICDT
2009
ACM
248views Database» more  ICDT 2009»
14 years 8 months ago
Automatic verification of data-centric business processes
We formalize and study business process systems that are centered around "business artifacts", or simply "artifacts". This approach focuses on data records, kn...
Alin Deutsch, Richard Hull, Fabio Patrizi, Victor ...