102 search results - page 8 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
TSE
1998
13 years 7 months ago
1998
—The main goal of this work is to propose a method to evaluate user interfaces using task models and logs generated from a user test of an application. The method can be incorpor...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
COMPSAC
2008
IEEE
13 years 7 months ago
2008
IEEE
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...