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DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
KDD
2009
ACM
181views Data Mining» more  KDD 2009»
14 years 2 months ago
An exploration of climate data using complex networks
To discover patterns in historical data, climate scientists have applied various clustering methods with the goal of identifying regions that share some common climatological beha...
Karsten Steinhaeuser, Nitesh V. Chawla, Auroop R. ...
DOCENG
2003
ACM
14 years 24 days ago
Using SVG as the rendering model for structured and graphically complex web material
This paper reports some experiments in using SVG (Scalable Vector Graphics), rather than the browser default of (X)HTML/CSS, as a potential Web-based rendering technology, in an a...
Julius C. Mong, David F. Brailsford
VIP
2001
13 years 9 months ago
Avatars: A Shifting Interaction
The intersection of theatre-performance, design, and informatics is a fertile area for a broader understanding of the possible design and interaction between people and avatars in...
Kristine Deray